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    Technical Notes - Microstructure in shear band observed by microfocus X-ray computed tomography

    New search for: Oda, M.
    New search for: Takemura, T.
    New search for: Takahashi, M.

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    Technical Notes - Microstructure in shear band observed by microfocus X-ray computed tomography

    New search for: Oda, M.
    New search for: Takemura, T.
    New search for: Takahashi, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Technical Notes - Microstructure in shear band observed by microfocus X-ray computed tomography

    New search for: Oda, M.
    New search for: Takemura, T.
    New search for: Takahashi, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Title:

    Technical Notes - Microstructure in shear band observed by microfocus X-ray computed tomography

    Contributors:

    Oda, M. (author) / Takemura, T. / Takahashi, M.

    Published in:

    Géotechnique ; 54

    Publication date:

    2004

    ISSN:

    0016-8505

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Keywords:

    Zeitschrift , Geotechnik

    Classification:

    BKL:  56.20 Ingenieurgeologie, Bodenmechanik / 56.20
    Local classification TIB:  275/6545

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