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Scattering - A Study of an AIEM Model for Bistatic Scattering From Randomly Rough Surfaces
Scattering - A Study of an AIEM Model for Bistatic Scattering From Randomly Rough Surfaces
Scattering - A Study of an AIEM Model for Bistatic Scattering From Randomly Rough Surfaces
Wu, T.-D. (author) / Chen, K.-S. / Shi, J. / Lee, H.-W. / Fung, A.K.
2008
Article (Journal)
Unknown
Local classification TIB:
770/3710/5670
BKL:
74.41
/
38.03
Methoden und Techniken der Geowissenschaften
/
74.41
Luftaufnahmen, Photogrammetrie
/
38.03
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