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Integrating ontological modelling and Bayesian inference for pattern classification in topographic vector data

Lüscher, Patrick

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Integrating ontological modelling and Bayesian inference for pattern classification in topographic vector data

Lüscher, Patrick

Integrating ontological modelling and Bayesian inference for pattern classification in topographic vector data

Lüscher, Patrick

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Order at Subito €

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Document information

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Document information

Title:

Integrating ontological modelling and Bayesian inference for pattern classification in topographic vector data

Contributors:

Lüscher, Patrick (author) / Weibel, Robert / Burghardt, Dirk

Published in:

Computers, environment and urban systems ; 33

Publication date:

2009

ISSN:

Type of media:

Article (Journal)

Type of material:

Print

Language:

English

Keywords:

Umwelt , Zeitschrift , Stadt , Datenverarbeitung

Classification:

BKL: 74.03 Methoden und Techniken der Geographie und Anthropogeographie / 74.03 / 43.03 Methoden der Umweltforschung und des Umweltschutzes / 74.72 Stadtplanung, kommunale Planung / 74.72 / 43.03

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