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    Bistatic system and baseline calibration in TanDEM-X to ensure the global digital elevation model quality

    New search for: Hueso González, Jaime
    New search for: Bachmann, Markus
    New search for: Krieger, Gerhard
    New search for: Zink, Manfred
    New search for: Schrank, Dirk
    New search for: Schwerdt, Marco

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    Bistatic system and baseline calibration in TanDEM-X to ensure the global digital elevation model quality

    New search for: Hueso González, Jaime
    New search for: Bachmann, Markus
    New search for: Krieger, Gerhard
    New search for: Zink, Manfred
    New search for: Schrank, Dirk
    New search for: Schwerdt, Marco

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Bistatic system and baseline calibration in TanDEM-X to ensure the global digital elevation model quality

    New search for: Hueso González, Jaime
    New search for: Bachmann, Markus
    New search for: Krieger, Gerhard
    New search for: Zink, Manfred
    New search for: Schrank, Dirk
    New search for: Schwerdt, Marco

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Bistatic system and baseline calibration in TanDEM-X to ensure the global digital elevation model quality

    Contributors:

    Hueso González, Jaime (author) / Walter Antony, John Mohan / Bachmann, Markus / Krieger, Gerhard / Zink, Manfred / Schrank, Dirk / Schwerdt, Marco

    Published in:

    ISPRS journal of photogrammetry and remote sensing ; 73

    Publication date:

    2012

    ISSN:

    0924-2716

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Keywords:

    Zeitschrift , Fotogrammetrie

    Classification:

    BKL:  38.73 Geodäsie / 74.41 Luftaufnahmen, Photogrammetrie

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