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    An Improved Attributed Scattering Model Optimized by Incremental Sparse Bayesian Learning

    New search for: Jin, Kan
    New search for: Xu, Bin
    New search for: Li, Zenghui
    New search for: Zhou, Wei
    New search for: Yang, Jian

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    An Improved Attributed Scattering Model Optimized by Incremental Sparse Bayesian Learning

    New search for: Jin, Kan
    New search for: Xu, Bin
    New search for: Li, Zenghui
    New search for: Zhou, Wei
    New search for: Yang, Jian

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    An Improved Attributed Scattering Model Optimized by Incremental Sparse Bayesian Learning

    New search for: Jin, Kan
    New search for: Xu, Bin
    New search for: Li, Zenghui
    New search for: Zhou, Wei
    New search for: Yang, Jian

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    An Improved Attributed Scattering Model Optimized by Incremental Sparse Bayesian Learning

    Contributors:

    Jin, Kan (author) / Xu, Bin / Li, Zenghui / Zhou, Wei / Yang, Jian

    Published in:

    IEEE transactions on geoscience and remote sensing

    Publication date:

    2016

    ISSN:

    0196-2892

    DOI:

    https://doi.org/10.1109/TGRS.2015.2509539

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Keywords:

    Fernerkundung , Zeitschrift , Messtechnik , Elektronik , Geowissenschaften

    Classification:

    Local classification TIB:  770/3710/5670
    BKL:  38.03 Methoden und Techniken der Geowissenschaften / 74.41 Luftaufnahmen, Photogrammetrie

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