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Muscovite single layer resolution: Secondary ion mass spectrometry depth profile

Jerigova, Monika

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Muscovite single layer resolution: Secondary ion mass spectrometry depth profile

Jerigova, Monika

Muscovite single layer resolution: Secondary ion mass spectrometry depth profile

Jerigova, Monika

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Document information

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Title:

Muscovite single layer resolution: Secondary ion mass spectrometry depth profile

Contributors:

Jerigova, Monika (author) / Szöcs, Vojtech / Janek, Marian / Lorenc, Dusan / Velic, Dusan

Published in:

Applied clay science

Publication date:

2016

ISSN:

DOI:

https://doi.org/10.1016/j.clay.2016.08.012

Type of media:

Article (Journal)

Type of material:

Print

Language:

English

Keywords:

Ton (Geologie) , Tonmineral , Tonmineralogie

Classification:

BKL: 38.30 Mineralogie / 58.45 / 38.30 / 58.45 Gesteinshüttenkunde / 56.20 Ingenieurgeologie, Bodenmechanik / 38.69 / 56.20 / 38.69 Bodenkunde: Sonstiges
Local classification TIB: 535/3730/3750

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