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Planar Defects

Williams, David B. / Carter, C. Barry

Abstract Internal interfaces (grain boundaries, phase boundaries, stacking faults) or external interfaces (i.e., surfaces) are perhaps the most important defects in crystalline engineering materials. Their common feature is that we can usually think of them as all being two-dimensional, or planar, defects. The main topics of this chapter will be: Characterizing which type of internal interface we have and determining its main parameters. Identifying lattice translations at these interfaces from the appearance of the diffraction-contrast images.

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Planar Defects

Williams, David B. / Carter, C. Barry

Abstract Internal interfaces (grain boundaries, phase boundaries, stacking faults) or external interfaces (i.e., surfaces) are perhaps the most important defects in crystalline engineering materials. Their common feature is that we can usually think of them as all being two-dimensional, or planar, defects. The main topics of this chapter will be: Characterizing which type of internal interface we have and determining its main parameters. Identifying lattice translations at these interfaces from the appearance of the diffraction-contrast images.

Planar Defects

Williams, David B. / Carter, C. Barry

Abstract Internal interfaces (grain boundaries, phase boundaries, stacking faults) or external interfaces (i.e., surfaces) are perhaps the most important defects in crystalline engineering materials. Their common feature is that we can usually think of them as all being two-dimensional, or planar, defects. The main topics of this chapter will be: Characterizing which type of internal interface we have and determining its main parameters. Identifying lattice translations at these interfaces from the appearance of the diffraction-contrast images.

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Title:

Planar Defects

Contributors:

Williams, David B. (author) / Carter, C. Barry (author)

Published in:

Transmission Electron Microscopy ; 379-399

Publication date:

1996-01-01

Size:

21 pages

ISBN:

978-0-306-45324-3 , 978-1-4757-2519-3

DOI:

https://doi.org/10.1007/978-1-4757-2519-3_24

Type of media:

Article/Chapter (Book)

Type of material:

Electronic Resource

Language:

English

Keywords:

Twin Boundary , Planar Defect , Simulated Image , Bloch Wave , Internal Interface Physics , Spectroscopy and Microscopy , Surface and Interface Science, Thin Films , Solid State Physics , Characterization and Evaluation of Materials , Biological Microscopy

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