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Structural Characterization of Molecules and Reaction Intermediates on Surfaces Using Synchrotron Radiation
Abstract One of the principal reasons for studying surfaces is to gain insight into industrially important chemical processes such as catalysis. Advancement in this area in surface chemistry has been aided by several developments in spectroscopic techniques over the past decade which have allowed increasingly detailed characterization of polyatomic adsorbates on single-crystal surfaces. For example, with vibrational spectroscopy [7.1] one can now routinely determine the character of the bonds within polyatomic adsorbates containing a dozen or more atoms and limited information on orientation can be obtained. Further structural information such as bond distances and binding sites have remained elusive, however, except for the simplest of cases. In this chapter we examine two related techniques employing synchrotron radiation which hold promise of providing such structural information: surface extended X-ray absorption fine structure (SEXAFS) and near edge X-ray absorption fine structure (NEXAFS). These techniques are particularly useful in studying surface chemistry in that they provide structural information not only about the surface-adsorbate bond but also about bonds within the adsorbate itself.
Structural Characterization of Molecules and Reaction Intermediates on Surfaces Using Synchrotron Radiation
Abstract One of the principal reasons for studying surfaces is to gain insight into industrially important chemical processes such as catalysis. Advancement in this area in surface chemistry has been aided by several developments in spectroscopic techniques over the past decade which have allowed increasingly detailed characterization of polyatomic adsorbates on single-crystal surfaces. For example, with vibrational spectroscopy [7.1] one can now routinely determine the character of the bonds within polyatomic adsorbates containing a dozen or more atoms and limited information on orientation can be obtained. Further structural information such as bond distances and binding sites have remained elusive, however, except for the simplest of cases. In this chapter we examine two related techniques employing synchrotron radiation which hold promise of providing such structural information: surface extended X-ray absorption fine structure (SEXAFS) and near edge X-ray absorption fine structure (NEXAFS). These techniques are particularly useful in studying surface chemistry in that they provide structural information not only about the surface-adsorbate bond but also about bonds within the adsorbate itself.
Structural Characterization of Molecules and Reaction Intermediates on Surfaces Using Synchrotron Radiation
Outka, D. A. (author) / Madix, R. J. (author)
1986-01-01
35 pages
Article/Chapter (Book)
Electronic Resource
English
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