A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Infrared Spectroscopy of Semiconductor Surfaces
Abstract Traditionally, photons have not been used as extensively as particles to study single crystal surfaces. While photons can effectively excite electrons at the surface, they cannot be confined to a few monolayers. Electromagnetic radiation is therefore not intrinsically surface sensitive. This fact is reflected in this review series, in the past six years only two articles have dealt with purely photon based techniques for single crystal surfaces [3.1,2]. Two factors have, however, contributed to a renewed interest in photon probes, particularly surface infrared spectroscopy (SIRS): 1) the development of faster and more powerful computers and faster and more sensitive IR detectors, and 2) the need to acquire information which cannot be readily derived from other experimental techniques. The dramatic improvement of high performance fast scanning interferometers results from the first and the recent predictive ability of first-principle calculations [3.3,4] is an example of the second. As a result, a number of laboratories around the world are now incorporating SIRS to investigate metal and semiconductor surfaces.
Infrared Spectroscopy of Semiconductor Surfaces
Abstract Traditionally, photons have not been used as extensively as particles to study single crystal surfaces. While photons can effectively excite electrons at the surface, they cannot be confined to a few monolayers. Electromagnetic radiation is therefore not intrinsically surface sensitive. This fact is reflected in this review series, in the past six years only two articles have dealt with purely photon based techniques for single crystal surfaces [3.1,2]. Two factors have, however, contributed to a renewed interest in photon probes, particularly surface infrared spectroscopy (SIRS): 1) the development of faster and more powerful computers and faster and more sensitive IR detectors, and 2) the need to acquire information which cannot be readily derived from other experimental techniques. The dramatic improvement of high performance fast scanning interferometers results from the first and the recent predictive ability of first-principle calculations [3.3,4] is an example of the second. As a result, a number of laboratories around the world are now incorporating SIRS to investigate metal and semiconductor surfaces.
Infrared Spectroscopy of Semiconductor Surfaces
Chabal, Y. J. (author)
1988-01-01
42 pages
Article/Chapter (Book)
Electronic Resource
English
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