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Diffraction from Small Volumes

Williams, David B. / Carter, C. Barry

Abstract A very important concept in TEM is that we only diffract from small volumes. By definition, no specimens are infinite in all directions and all defects are small. Of course, the beam is also never infinitely wide! This chapter therefore discusses how the size of what we are examining influences the appearance of the DP. Although we will discuss many different aspects of diffraction, there are three important ideas which underlie all this discussion: We are diffracting from small volumes. We are diffracting from crystals. We need to index the DPs we see and relate the patterns to the image.

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Diffraction from Small Volumes

Williams, David B. / Carter, C. Barry

Abstract A very important concept in TEM is that we only diffract from small volumes. By definition, no specimens are infinite in all directions and all defects are small. Of course, the beam is also never infinitely wide! This chapter therefore discusses how the size of what we are examining influences the appearance of the DP. Although we will discuss many different aspects of diffraction, there are three important ideas which underlie all this discussion: We are diffracting from small volumes. We are diffracting from crystals. We need to index the DPs we see and relate the patterns to the image.

Diffraction from Small Volumes

Williams, David B. / Carter, C. Barry

Abstract A very important concept in TEM is that we only diffract from small volumes. By definition, no specimens are infinite in all directions and all defects are small. Of course, the beam is also never infinitely wide! This chapter therefore discusses how the size of what we are examining influences the appearance of the DP. Although we will discuss many different aspects of diffraction, there are three important ideas which underlie all this discussion: We are diffracting from small volumes. We are diffracting from crystals. We need to index the DPs we see and relate the patterns to the image.

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Title:

Diffraction from Small Volumes

Contributors:

Williams, David B. (author) / Carter, C. Barry (author)

Published in:

Transmission Electron Microscopy ; 251-263

Publication date:

1996-01-01

Size:

13 pages

ISBN:

978-0-306-45324-3 , 978-1-4757-2519-3

DOI:

https://doi.org/10.1007/978-1-4757-2519-3_17

Type of media:

Article/Chapter (Book)

Type of material:

Electronic Resource

Language:

English

Keywords:

Reciprocal Lattice , Diffract Beam , Planar Defect , Diffuse Scattering , Dispersion Surface Physics , Spectroscopy and Microscopy , Surface and Interface Science, Thin Films , Solid State Physics , Characterization and Evaluation of Materials , Biological Microscopy

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