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Electron Energy-Loss Spectroscopy for Metal Surfaces
Abstract One of the most powerful experimental techniques for the study of the elementary excitations in solids has proved to be the electron energy-loss spectroscopy (EELS). Initially, during the 1960s, this technique was used to investigate excitation of plasma waves and of electronic transitions. The energy losses being of many eV, a resolution of typically 250 meV was considered to be more than enough in electron and plasmon spectroscopy. The order of magnitude of the phonon energies however is much smaller, so that the overall resolution that is needed in phonon spectroscopy must be better than 30 meV. Such performance has been obtained with a new generation of high-resolution spectrometers based on the use of cylindrical electrostatic deflectors [1]. One (or more) deflector works as monochromator and, in conjunction with an accelerating lens system, forms a source of highly monoenergetic primary electrons. The scattered electrons are analyzed in energy by another (or more) deflector. A resolution as good as 3.7 meV has been obtained with this kind of spectrometer [2].
Electron Energy-Loss Spectroscopy for Metal Surfaces
Abstract One of the most powerful experimental techniques for the study of the elementary excitations in solids has proved to be the electron energy-loss spectroscopy (EELS). Initially, during the 1960s, this technique was used to investigate excitation of plasma waves and of electronic transitions. The energy losses being of many eV, a resolution of typically 250 meV was considered to be more than enough in electron and plasmon spectroscopy. The order of magnitude of the phonon energies however is much smaller, so that the overall resolution that is needed in phonon spectroscopy must be better than 30 meV. Such performance has been obtained with a new generation of high-resolution spectrometers based on the use of cylindrical electrostatic deflectors [1]. One (or more) deflector works as monochromator and, in conjunction with an accelerating lens system, forms a source of highly monoenergetic primary electrons. The scattered electrons are analyzed in energy by another (or more) deflector. A resolution as good as 3.7 meV has been obtained with this kind of spectrometer [2].
Electron Energy-Loss Spectroscopy for Metal Surfaces
Nizzoli, Fabrizio (author)
1985-01-01
8 pages
Article/Chapter (Book)
Electronic Resource
English
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