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High-Resolution Electron Microscopy in Surface Science

Smith, D. J.

Abstract A wide variety of diffraction, spectroscopy, and microscopy techniques are now available for the characterisation of surfaces, but only the microscopical methods, primarily using electrons, are able to provide direct real-space information about local inhomogeneities such as surface steps, terraces, domains, and defects. As a consequence of technical improvements, high-resolution electron microscopes in particular are nowadays capable of atomic imaging, and electron microscopists are already starting to utilise this capability in their studies of surfaces. Subnanometer surface detail can be resolved in the reflection imaging mode and atomic-scale features are visible in the transmission and profile imaging modes. The results already available indicate that these high-resolution electron microscopy (HREM) techniques should be indispensable to obtaining a detailed understanding of many surfaces and their macroscopic properties.

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High-Resolution Electron Microscopy in Surface Science

Smith, D. J.

Abstract A wide variety of diffraction, spectroscopy, and microscopy techniques are now available for the characterisation of surfaces, but only the microscopical methods, primarily using electrons, are able to provide direct real-space information about local inhomogeneities such as surface steps, terraces, domains, and defects. As a consequence of technical improvements, high-resolution electron microscopes in particular are nowadays capable of atomic imaging, and electron microscopists are already starting to utilise this capability in their studies of surfaces. Subnanometer surface detail can be resolved in the reflection imaging mode and atomic-scale features are visible in the transmission and profile imaging modes. The results already available indicate that these high-resolution electron microscopy (HREM) techniques should be indispensable to obtaining a detailed understanding of many surfaces and their macroscopic properties.

High-Resolution Electron Microscopy in Surface Science

Smith, D. J.

Abstract A wide variety of diffraction, spectroscopy, and microscopy techniques are now available for the characterisation of surfaces, but only the microscopical methods, primarily using electrons, are able to provide direct real-space information about local inhomogeneities such as surface steps, terraces, domains, and defects. As a consequence of technical improvements, high-resolution electron microscopes in particular are nowadays capable of atomic imaging, and electron microscopists are already starting to utilise this capability in their studies of surfaces. Subnanometer surface detail can be resolved in the reflection imaging mode and atomic-scale features are visible in the transmission and profile imaging modes. The results already available indicate that these high-resolution electron microscopy (HREM) techniques should be indispensable to obtaining a detailed understanding of many surfaces and their macroscopic properties.

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Title:

High-Resolution Electron Microscopy in Surface Science

Contributors:

Smith, D. J. (author)

Published in:

Chemistry and Physics of Solid Surfaces VI ; 413-433

Springer Series in Surface Sciences ; 5

Publication date:

1986-01-01

Size:

21 pages

ISBN:

978-3-642-82729-7 , 978-3-642-82727-3

ISSN:

DOI:

https://doi.org/10.1007/978-3-642-82727-3_15

Type of media:

Article/Chapter (Book)

Type of material:

Electronic Resource

Language:

English

Keywords:

Baton Rouge , Diffract Beam , High Resolution Electron Microscopy , Surface Step , Objective Aperture Physics , Surface and Interface Science, Thin Films , Surfaces and Interfaces, Thin Films , Physical Chemistry

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