A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Scanning Tunneling Optical Microscopy
Abstract For overpassing the classical limit of resolution in optical microscopy, it is necessary to detect the light diffracted from small objects in the near field and not in the far field as in classical microscopy. A particular case is the detection of the evanescent field lying on the surface of a guiding structure. These surface waves interact with the object details and then can be used for determining the topography of the object. The main problem is the detection because the light beam is confined on the object surface. A solution consists of frustrating the evanescent field by means of a dielectric probe. The conversion of the inhomogeneous waves into homogeneous ones is fundamentally similar to the electronic tunneling effect. Subwavelength resolution can be obtained by placing a suitable optical stylus connected to an optical fibre near the surface. A xyz piezo-electric micropositioning system allows then to scan the object surface under test.
Scanning Tunneling Optical Microscopy
Abstract For overpassing the classical limit of resolution in optical microscopy, it is necessary to detect the light diffracted from small objects in the near field and not in the far field as in classical microscopy. A particular case is the detection of the evanescent field lying on the surface of a guiding structure. These surface waves interact with the object details and then can be used for determining the topography of the object. The main problem is the detection because the light beam is confined on the object surface. A solution consists of frustrating the evanescent field by means of a dielectric probe. The conversion of the inhomogeneous waves into homogeneous ones is fundamentally similar to the electronic tunneling effect. Subwavelength resolution can be obtained by placing a suitable optical stylus connected to an optical fibre near the surface. A xyz piezo-electric micropositioning system allows then to scan the object surface under test.
Scanning Tunneling Optical Microscopy
Courjon, Daniel (author)
1990-01-01
9 pages
Article/Chapter (Book)
Electronic Resource
English
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