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Scanning Spectro-Microscopy with 250 to 800 eV X-Rays

Ade, H. / Ko, C.-H.

Abstract We describe spectromicroscopy experiments at the X1A facility at the National Synchrotron Light Source. In these efforts, two scanning x-ray microscopes based on zone plate optics are utilized. One of these is an ultrahigh vacuum scanning photoemission microscope (SPEM) solely intended for surface characterization, while the other is a scanning transmission x-ray microscope (STXM). The former was substantially modified during the last few years and recently completed the first tests. We will describe its performance and outline further improvements. STXM has been utilized to provide chemical contrast via absorption spectroscopy in studies of a variety of polymeric materials in transmission. A spatial resolution of 30-40 ran and an energy resolution of 400 meV could be achieved in these experiments.

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Scanning Spectro-Microscopy with 250 to 800 eV X-Rays

Ade, H. / Ko, C.-H.

Abstract We describe spectromicroscopy experiments at the X1A facility at the National Synchrotron Light Source. In these efforts, two scanning x-ray microscopes based on zone plate optics are utilized. One of these is an ultrahigh vacuum scanning photoemission microscope (SPEM) solely intended for surface characterization, while the other is a scanning transmission x-ray microscope (STXM). The former was substantially modified during the last few years and recently completed the first tests. We will describe its performance and outline further improvements. STXM has been utilized to provide chemical contrast via absorption spectroscopy in studies of a variety of polymeric materials in transmission. A spatial resolution of 30-40 ran and an energy resolution of 400 meV could be achieved in these experiments.

Scanning Spectro-Microscopy with 250 to 800 eV X-Rays

Ade, H. / Ko, C.-H.

Abstract We describe spectromicroscopy experiments at the X1A facility at the National Synchrotron Light Source. In these efforts, two scanning x-ray microscopes based on zone plate optics are utilized. One of these is an ultrahigh vacuum scanning photoemission microscope (SPEM) solely intended for surface characterization, while the other is a scanning transmission x-ray microscope (STXM). The former was substantially modified during the last few years and recently completed the first tests. We will describe its performance and outline further improvements. STXM has been utilized to provide chemical contrast via absorption spectroscopy in studies of a variety of polymeric materials in transmission. A spatial resolution of 30-40 ran and an energy resolution of 400 meV could be achieved in these experiments.

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Title:

Scanning Spectro-Microscopy with 250 to 800 eV X-Rays

Contributors:

Ade, H. (author) / Ko, C.-H. (author)

Published in:

Chemical, Structural and Electronic Analysis of Heterogeneous Surfaces on Nanometer Scale ; 53-74

NATO ASI Series ; 333

Publication date:

1997-01-01

Size:

22 pages

ISBN:

978-94-010-6414-9 , 978-94-011-5724-7

ISSN:

DOI:

https://doi.org/10.1007/978-94-011-5724-7_4

Type of media:

Article/Chapter (Book)

Type of material:

Electronic Resource

Language:

English

Keywords:

Photon Energy , Energy Resolution , Orientational Order , Zone Plate , Contrast Reversal Physics , Condensed Matter Physics , Surfaces and Interfaces, Thin Films , Physical Chemistry , Characterization and Evaluation of Materials , Measurement Science and Instrumentation

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