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Tunneling Current Between Two Nonplanar Surfaces

Sacks, W. / Gauthier, S. / Rousset, S. / Klein, J.

Abstract The problem of determining the tunneling current between two electrodes that are nonplanar is essential to the theory of Scanning Tunneling Microscopy (S.T.M.) [1’10]. J. Tersoff and D. R. Hamann have shown that for a spherical tip as one electrode, and including only an evanescent s wave function, the current is proportional to the local density of states (LDOS) of the second electrode, at the Fermi level, evaluated at the center of the tip [1,2].

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Tunneling Current Between Two Nonplanar Surfaces

Sacks, W. / Gauthier, S. / Rousset, S. / Klein, J.

Abstract The problem of determining the tunneling current between two electrodes that are nonplanar is essential to the theory of Scanning Tunneling Microscopy (S.T.M.) [1’10]. J. Tersoff and D. R. Hamann have shown that for a spherical tip as one electrode, and including only an evanescent s wave function, the current is proportional to the local density of states (LDOS) of the second electrode, at the Fermi level, evaluated at the center of the tip [1,2].

Tunneling Current Between Two Nonplanar Surfaces

Sacks, W. / Gauthier, S. / Rousset, S. / Klein, J.

Abstract The problem of determining the tunneling current between two electrodes that are nonplanar is essential to the theory of Scanning Tunneling Microscopy (S.T.M.) [1’10]. J. Tersoff and D. R. Hamann have shown that for a spherical tip as one electrode, and including only an evanescent s wave function, the current is proportional to the local density of states (LDOS) of the second electrode, at the Fermi level, evaluated at the center of the tip [1,2].

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Title:

Tunneling Current Between Two Nonplanar Surfaces

Contributors:

Sacks, W. (author) / Gauthier, S. (author) / Rousset, S. (author) / Klein, J. (author)

Published in:

The Structure of Surfaces II ; 10-13

Springer Series in Surface Sciences ; 11

Publication date:

1988-01-01

Size:

4 pages

ISBN:

978-3-642-73345-1 , 978-3-642-73343-7

ISSN:

DOI:

https://doi.org/10.1007/978-3-642-73343-7_3

Type of media:

Article/Chapter (Book)

Type of material:

Electronic Resource

Language:

English

Keywords:

Fermi Level , Scan Tunneling Microscopy , Additional Convolution , Isodensity Contour , Simple Convolution Physics , Surface and Interface Science, Thin Films , Surfaces and Interfaces, Thin Films , Crystallography

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