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Strain Effects in Vamas Round Robin Test Wires

Katagiri, K. / Saito, K. / Ohgami, M. / Okada, T. / Nagata, A. / Noto, K. / Watanabe, K. / Itoh, K. / Wada, H. / Tachikawa, K. / ... [more]

Abstract The strain characteristics of critical current, Ic, in three kinds of VAMAS round robin test wires were evaluated. The multifilamentary Nb3Sn samples measured are: bronze route Ta added and internally stabilized wire A, Ti added and externally stabilized wire B and internal tin diffusion processed wire C, respectively. The strain for Ic peak ranged 0.20–0.30 % and the reversible strain limit 0.8–1.1 %. The results obtained at 15 T in three institutes, NIST, Rutherford Lab. and Osaka/Tohoku Univ., are compared. Fairly good agreement was obtained. The strain sensitivity was higher in the order of C, A and B. This can be mainly attributed to the effect of addition of the third element. The correlation between the strain sensitivity and the scatter of critical currents measured in the round robin test participant laboratories is briefly discussed.

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Strain Effects in Vamas Round Robin Test Wires

Katagiri, K. / Saito, K. / Ohgami, M. / Okada, T. / Nagata, A. / Noto, K. / Watanabe, K. / Itoh, K. / Wada, H. / Tachikawa, K. / ... [more]

Abstract The strain characteristics of critical current, Ic, in three kinds of VAMAS round robin test wires were evaluated. The multifilamentary Nb3Sn samples measured are: bronze route Ta added and internally stabilized wire A, Ti added and externally stabilized wire B and internal tin diffusion processed wire C, respectively. The strain for Ic peak ranged 0.20–0.30 % and the reversible strain limit 0.8–1.1 %. The results obtained at 15 T in three institutes, NIST, Rutherford Lab. and Osaka/Tohoku Univ., are compared. Fairly good agreement was obtained. The strain sensitivity was higher in the order of C, A and B. This can be mainly attributed to the effect of addition of the third element. The correlation between the strain sensitivity and the scatter of critical currents measured in the round robin test participant laboratories is briefly discussed.

Strain Effects in Vamas Round Robin Test Wires

Katagiri, K. / Saito, K. / Ohgami, M. / Okada, T. / Nagata, A. / Noto, K. / Watanabe, K. / Itoh, K. / Wada, H. / Tachikawa, K. / ... [more]

Abstract The strain characteristics of critical current, Ic, in three kinds of VAMAS round robin test wires were evaluated. The multifilamentary Nb3Sn samples measured are: bronze route Ta added and internally stabilized wire A, Ti added and externally stabilized wire B and internal tin diffusion processed wire C, respectively. The strain for Ic peak ranged 0.20–0.30 % and the reversible strain limit 0.8–1.1 %. The results obtained at 15 T in three institutes, NIST, Rutherford Lab. and Osaka/Tohoku Univ., are compared. Fairly good agreement was obtained. The strain sensitivity was higher in the order of C, A and B. This can be mainly attributed to the effect of addition of the third element. The correlation between the strain sensitivity and the scatter of critical currents measured in the round robin test participant laboratories is briefly discussed.

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Title:

Strain Effects in Vamas Round Robin Test Wires

Contributors:

Katagiri, K. (author) / Saito, K. (author) / Ohgami, M. (author) / Okada, T. (author) / Nagata, A. (author) / Noto, K. (author) / Watanabe, K. (author) / Itoh, K. (author) / Wada, H. (author) / Tachikawa, K. (author)

Published in:

Advances in Cryogenic Engineering Materials ; 61-68

An International Cryogenic Materials Conference Publication ; 36

Publication date:

1990-01-01

Size:

8 pages

ISBN:

978-1-4613-9882-0 , 978-1-4613-9880-6

ISSN:

DOI:

https://doi.org/10.1007/978-1-4613-9880-6_8

Type of media:

Article/Chapter (Book)

Type of material:

Electronic Resource

Language:

English

Keywords:

Critical Current , Strain Sensitivity , Strain Effect , Interlaboratory Comparison , Strain Dependence Chemistry , Biochemical Engineering , Characterization and Evaluation of Materials , Mechanical Engineering

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