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Tensor LEED; New Prospects for Surface Structure Determination by LEED

Rous, P. J. / Pendry, J. B.

Abstract Recently we have proposed a new calculational scheme for the evaluation of LEED I/V spectra from complex surfaces called Tensor LEED (TLEED) [1–3]. This is primarily a perturbative scheme which allows the rapid evaluation of I/V spectra from a complex trial structure which is considered to be a distortion of a (simpler) reference surface. This technique is in many cases, two to three orders of magnitude faster than conventional methods when applied to a standard trial and error structure determination.

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Tensor LEED; New Prospects for Surface Structure Determination by LEED

Rous, P. J. / Pendry, J. B.

Abstract Recently we have proposed a new calculational scheme for the evaluation of LEED I/V spectra from complex surfaces called Tensor LEED (TLEED) [1–3]. This is primarily a perturbative scheme which allows the rapid evaluation of I/V spectra from a complex trial structure which is considered to be a distortion of a (simpler) reference surface. This technique is in many cases, two to three orders of magnitude faster than conventional methods when applied to a standard trial and error structure determination.

Tensor LEED; New Prospects for Surface Structure Determination by LEED

Rous, P. J. / Pendry, J. B.

Abstract Recently we have proposed a new calculational scheme for the evaluation of LEED I/V spectra from complex surfaces called Tensor LEED (TLEED) [1–3]. This is primarily a perturbative scheme which allows the rapid evaluation of I/V spectra from a complex trial structure which is considered to be a distortion of a (simpler) reference surface. This technique is in many cases, two to three orders of magnitude faster than conventional methods when applied to a standard trial and error structure determination.

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Title:

Tensor LEED; New Prospects for Surface Structure Determination by LEED

Contributors:

Rous, P. J. (author) / Pendry, J. B. (author)

Published in:

The Structure of Surfaces II ; 14-18

Springer Series in Surface Sciences ; 11

Publication date:

1988-01-01

Size:

5 pages

ISBN:

978-3-642-73345-1 , 978-3-642-73343-7

ISSN:

DOI:

https://doi.org/10.1007/978-3-642-73343-7_4

Type of media:

Article/Chapter (Book)

Type of material:

Electronic Resource

Language:

English

Keywords:

Base Point , Reference Surface , Reference Structure , Structure Search , Trial Structure Physics , Surface and Interface Science, Thin Films , Surfaces and Interfaces, Thin Films , Crystallography

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