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    Molecular Electronic Plasmonics: In Operando Characterization and Control over Intermittent Light Emission from Molecular Tunnel Junctions via Molecular Backbone Rigidity (Adv. Sci. 20/2019)

    New search for: Wang, Tao
    New search for: Du, Wei
    New search for: Tomczak, Nikodem
    New search for: Wang, Lejia
    New search for: Nijhuis, Christian A.

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    Molecular Electronic Plasmonics: In Operando Characterization and Control over Intermittent Light Emission from Molecular Tunnel Junctions via Molecular Backbone Rigidity (Adv. Sci. 20/2019)

    New search for: Wang, Tao
    New search for: Du, Wei
    New search for: Tomczak, Nikodem
    New search for: Wang, Lejia
    New search for: Nijhuis, Christian A.

    Access

    Download

    Molecular Electronic Plasmonics: In Operando Characterization and Control over Intermittent Light Emission from Molecular Tunnel Junctions via Molecular Backbone Rigidity (Adv. Sci. 20/2019)

    New search for: Wang, Tao
    New search for: Du, Wei
    New search for: Tomczak, Nikodem
    New search for: Wang, Lejia
    New search for: Nijhuis, Christian A.

    Access

    Download

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    Document information
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    Document information
    Title:

    Molecular Electronic Plasmonics: In Operando Characterization and Control over Intermittent Light Emission from Molecular Tunnel Junctions via Molecular Backbone Rigidity (Adv. Sci. 20/2019)

    Contributors:

    Wang, Tao (author) / Du, Wei (author) / Tomczak, Nikodem (author) / Wang, Lejia (author) / Nijhuis, Christian A. (author)

    Published in:

    Advanced Science ; 6

    Publication date:

    2019-10-01

    Size:

    1 pages

    ISSN:

    2198-3844

    DOI:

    https://doi.org/10.1002/advs.201970122

    Type of media:

    Article (Journal)

    Type of material:

    Electronic Resource

    Language:

    English

    Keywords:

    noise characterization , plasmon excitation , molecular tunneling junctions , molecular electronics , intermittent light emission

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