Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Laser reflectometry for in-situ monitoring of the epitaxial growth of thin films (Invited Paper) [2403-50]
Laser reflectometry for in-situ monitoring of the epitaxial growth of thin films (Invited Paper) [2403-50]
Laser reflectometry for in-situ monitoring of the epitaxial growth of thin films (Invited Paper) [2403-50]
Farrell, T. (Autor:in) / Weightman, P. (Autor:in) / Dobowski, J. J. / SPIE
Conference, Laser-induced thin film processing ; 1995 ; San Jose; CA
01.01.1995
10 pages
Aufsatz (Konferenz)
Englisch
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