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A platform for research: civil engineering, architecture and urbanism
Laser reflectometry for in-situ monitoring of the epitaxial growth of thin films (Invited Paper) [2403-50]
Laser reflectometry for in-situ monitoring of the epitaxial growth of thin films (Invited Paper) [2403-50]
Laser reflectometry for in-situ monitoring of the epitaxial growth of thin films (Invited Paper) [2403-50]
Farrell, T. (author) / Weightman, P. (author) / Dobowski, J. J. / SPIE
Conference, Laser-induced thin film processing ; 1995 ; San Jose; CA
1995-01-01
10 pages
Conference paper
English
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