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Raman microscopic analysis in museology (Invited Paper) [4098-36]

Withnall, R. / Derbyshire, A. / Thiel, S. / Hughes, M. J. / SPIE - International Society for Optical Engineering

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Raman microscopic analysis in museology (Invited Paper) [4098-36]

Withnall, R. / Derbyshire, A. / Thiel, S. / Hughes, M. J. / SPIE - International Society for Optical Engineering

Raman microscopic analysis in museology (Invited Paper) [4098-36]

Withnall, R. / Derbyshire, A. / Thiel, S. / Hughes, M. J. / SPIE - International Society for Optical Engineering

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Titel:

Raman microscopic analysis in museology (Invited Paper) [4098-36]

Beteiligte:

Withnall, R. (Autor:in) / Derbyshire, A. (Autor:in) / Thiel, S. (Autor:in) / Hughes, M. J. (Autor:in) / Andrews, D. L. / SPIE - International Society for Optical Engineering

Kongress:

Conference, Optical devices and diagnostics in materials science ; 2000 ; San Diego, CA

Erschienen in:

Optical devices and diagnostics in materials science ; 217-231

PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 4098

Erscheinungsdatum:

01.01.2000

Format / Umfang:

15 pages

ISBN:

0819437433

ISSN:

0277-786X

Medientyp:

Aufsatz (Konferenz)

Format:

Sprache:

Englisch

Schlagwörter:

optical devices , SPIE , materials science , optical engineering

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