Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
AFM data analysis: separating surface microtopography from instrumental artifacts [4100-20]
AFM data analysis: separating surface microtopography from instrumental artifacts [4100-20]
AFM data analysis: separating surface microtopography from instrumental artifacts [4100-20]
Huser, D. (Autor:in) / Rothe, H. (Autor:in) / Gu, Z.-H. / Maradudin, A. A. / SPIE
Conference; 3rd, Scattering and surface roughness ; 2000 ; San Diego, CA
01.01.2000
11 pages
Aufsatz (Konferenz)
Englisch
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