Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    AFM data analysis: separating surface microtopography from instrumental artifacts [4100-20]

    New search for: Huser, D.
    New search for: Rothe, H.
    New search for: Gu, Z.-H.
    New search for: Maradudin, A. A.
    New search for: SPIE

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    AFM data analysis: separating surface microtopography from instrumental artifacts [4100-20]

    New search for: Huser, D.
    New search for: Rothe, H.
    New search for: Gu, Z.-H.
    New search for: Maradudin, A. A.
    New search for: SPIE

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    AFM data analysis: separating surface microtopography from instrumental artifacts [4100-20]

    New search for: Huser, D.
    New search for: Rothe, H.
    New search for: Gu, Z.-H.
    New search for: Maradudin, A. A.
    New search for: SPIE

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    AFM data analysis: separating surface microtopography from instrumental artifacts [4100-20]

    Contributors:

    Huser, D. (author) / Rothe, H. (author) / Gu, Z.-H. / Maradudin, A. A. / SPIE

    Conference:

    Conference; 3rd, Scattering and surface roughness ; 2000 ; San Diego, CA

    Published in:

    Scattering and surface roughness ; 156-166

    PROCEEDINGS- SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING ; 4100

    Publication date:

    2000-01-01

    Size:

    11 pages

    ISBN:

    081943745X

    ISSN:

    0277-786X

    Type of media:

    Conference paper

    Type of material:

    Print

    Language:

    English

    Keywords:

    scattering , surface roughness , SPIE

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Measuring surface roughness in transmission geometry [4100-25]

    Ignatovich, V. K. / SPIE | British Library Conference Proceedings | 2000

    Computer simulation of rough-surface microtopography

    Sutyagin, O. V. / Bolotov, A. N. / Rachishkin, A. A. | British Library Online Contents | 2015

    Surface microtopography of surfactant modified montmorillonite

    Zhu, Jianxi | Online Contents | 2009

    Surface microtopography of surfactant modified montmorillonite

    Zhu, Jianxi | Online Contents | 2009

    Surface plasmon polariton propagation near an index step [4100-01]

    Leskova, T. A. / Maradudin, A. A. / Zierau, W. et al. | British Library Conference Proceedings | 2000

    Back to top