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Nondestructive and contactless determination of layer and coating thickness [5767-50]
Nondestructive and contactless determination of layer and coating thickness [5767-50]
Nondestructive and contactless determination of layer and coating thickness [5767-50]
Sklarczyk, C. (Autor:in) / Netzelmann, U. (Autor:in) / Kreier, P. (Autor:in) / Gebhardt, W. (Autor:in) / Shull, Peter J. / Gyekenyesi, Andrew L. / Mufti, Aftab A. / Society of Photo-optical Instrumentation Engineers
Conference; 4th, Nondestructive evaluation and Health monitoring of aerospace materials, composites, and civil infrastructure IV ; 2005 ; San Diego, CA
01.01.2005
11 pages
Aufsatz (Konferenz)
Englisch
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