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Nondestructive and contactless determination of layer and coating thickness [5767-50]
Nondestructive and contactless determination of layer and coating thickness [5767-50]
Nondestructive and contactless determination of layer and coating thickness [5767-50]
Sklarczyk, C. (author) / Netzelmann, U. (author) / Kreier, P. (author) / Gebhardt, W. (author) / Shull, Peter J. / Gyekenyesi, Andrew L. / Mufti, Aftab A. / Society of Photo-optical Instrumentation Engineers
Conference; 4th, Nondestructive evaluation and Health monitoring of aerospace materials, composites, and civil infrastructure IV ; 2005 ; San Diego, CA
2005-01-01
11 pages
Conference paper
English
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