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Synchrotron X-Ray microtomography: a Hig Resolution, Fast and Quantitative Tool for Rock Characterization
Synchrotron X-Ray microtomography: a Hig Resolution, Fast and Quantitative Tool for Rock Characterization
Synchrotron X-Ray microtomography: a Hig Resolution, Fast and Quantitative Tool for Rock Characterization
Boller, E. (Autor:in) / Cloetens, P. (Autor:in) / Baruchel, J. (Autor:in) / Tafforeau, P. (Autor:in) / Rozenbaum, O. (Autor:in) / Pourchez, J. (Autor:in) / Desrues, J. / Viggiani, G. / Besuelle, P.
CONFERENCE; 2nd, Advances in x-ray tommography for geomaterials ; 2006 ; Aussois, France
01.01.2006
10 pages
Includes bibliographical references and index
Aufsatz (Konferenz)
Englisch
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