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Synchrotron X-Ray microtomography: a Hig Resolution, Fast and Quantitative Tool for Rock Characterization
Synchrotron X-Ray microtomography: a Hig Resolution, Fast and Quantitative Tool for Rock Characterization
Synchrotron X-Ray microtomography: a Hig Resolution, Fast and Quantitative Tool for Rock Characterization
Boller, E. (author) / Cloetens, P. (author) / Baruchel, J. (author) / Tafforeau, P. (author) / Rozenbaum, O. (author) / Pourchez, J. (author) / Desrues, J. / Viggiani, G. / Besuelle, P.
CONFERENCE; 2nd, Advances in x-ray tommography for geomaterials ; 2006 ; Aussois, France
2006-01-01
10 pages
Includes bibliographical references and index
Conference paper
English
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