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Measuring Dielectric Constant in Highly Conductive Soils Based on Surface Reflection Coefficients
Measuring Dielectric Constant in Highly Conductive Soils Based on Surface Reflection Coefficients
Measuring Dielectric Constant in Highly Conductive Soils Based on Surface Reflection Coefficients
Chen, R. (Autor:in) / Xu, W. (Autor:in) / Chen, Y. (Autor:in) / Chen, W. (Autor:in) / Zhang, Xiong / American Society of Civil Engineers
Conference, Characterization, modeling, and performance of geomaterials ; 2009 ; Changsha, Hunan, China
01.01.2009
8 pages
Aufsatz (Konferenz)
Englisch
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Measuring Dielectric Constant in Highly Conductive Soils Based on Surface Reflection Coefficients
Online Contents | 2009
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