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Measuring Dielectric Constant in Highly Conductive Soils Based on Surface Reflection Coefficients
Measuring Dielectric Constant in Highly Conductive Soils Based on Surface Reflection Coefficients
Measuring Dielectric Constant in Highly Conductive Soils Based on Surface Reflection Coefficients
Chen, R. (author) / Xu, W. (author) / Chen, Y. (author) / Chen, W. (author) / Zhang, Xiong / American Society of Civil Engineers
Conference, Characterization, modeling, and performance of geomaterials ; 2009 ; Changsha, Hunan, China
2009-01-01
8 pages
Conference paper
English
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