Determination of preferred orientation degree of portlandite by using rocking curve of diffraction line

Yuan, Chen Zhi / Min, Zhao Wei / Jiang, Lin | Springer Verlag | 1988

Determination of preferred orientation degree of portlandite by using rocking curve of diffraction line

Yuan, Chen Zhi / Min, Zhao Wei / Jiang, Lin | Online Contents | 1988

X-Ray Rocking Curve Characterization of SiC Substrates

Yoganathan, M. / Wu, P. / Zwieback, I. | British Library Online Contents | 2009

Characterization of SiC Substrates Using X-Ray Rocking Curve Mapping

Yoganathan, M. / Emorhokpor, E. / Kerr, T. et al. | British Library Online Contents | 2006

Mosaicity and Wafer Bending in SiC Wafers as Measured by Double and Triple Crystal X-Ray Rocking Curve and Peak Position Maps

Kirchner, K. W. / Jones, K. A. / Derenge, M. A. et al. | British Library Online Contents | 2007