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X-Ray Fluorescence Analysis of Oxide Magnetic Tape Using Thin Layer Fundamental Parameter Analysis
X-Ray Fluorescence Analysis of Oxide Magnetic Tape Using Thin Layer Fundamental Parameter Analysis
X-Ray Fluorescence Analysis of Oxide Magnetic Tape Using Thin Layer Fundamental Parameter Analysis
Kimura, K. (Autor:in) / Wakamatsu, H. (Autor:in) / Kitamura, T. (Autor:in) / Maeda, R. (Autor:in)
ADVANCES IN X RAY ANALYSIS ; 1133
01.01.1993
1133 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
539.7222
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