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    X-Ray Fluorescence Analysis of Oxide Magnetic Tape Using Thin Layer Fundamental Parameter Analysis

    New search for: Kimura, K.
    New search for: Wakamatsu, H.
    New search for: Kitamura, T.
    New search for: Maeda, R.

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    X-Ray Fluorescence Analysis of Oxide Magnetic Tape Using Thin Layer Fundamental Parameter Analysis

    New search for: Kimura, K.
    New search for: Wakamatsu, H.
    New search for: Kitamura, T.
    New search for: Maeda, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    X-Ray Fluorescence Analysis of Oxide Magnetic Tape Using Thin Layer Fundamental Parameter Analysis

    New search for: Kimura, K.
    New search for: Wakamatsu, H.
    New search for: Kitamura, T.
    New search for: Maeda, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    X-Ray Fluorescence Analysis of Oxide Magnetic Tape Using Thin Layer Fundamental Parameter Analysis

    Contributors:

    Kimura, K. (author) / Wakamatsu, H. (author) / Kitamura, T. (author) / Maeda, R. (author)

    Published in:

    ADVANCES IN X RAY ANALYSIS ; 1133

    Publication date:

    1993-01-01

    Size:

    1133 pages

    ISSN:

    0376-0308

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  539.7222

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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