Investigation of Semiconductor Heterostructures by White Beam Synchrotron X-Ray Topography in Grazing Bragg-Laue and Conventional Bragg Geometries: Fid-Bau Portal

Investigation of Semiconductor Heterostructures by White Beam Synchrotron X-Ray Topography in Grazing Bragg-Laue and Conventional Bragg Geometries

Yao, G.-D. / Wu, J. / Fanning, T. / Dudley, M.

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Investigation of Semiconductor Heterostructures by White Beam Synchrotron X-Ray Topography in Grazing Bragg-Laue and Conventional Bragg Geometries

Yao, G.-D. / Wu, J. / Fanning, T. / Dudley, M.

Investigation of Semiconductor Heterostructures by White Beam Synchrotron X-Ray Topography in Grazing Bragg-Laue and Conventional Bragg Geometries

Yao, G.-D. / Wu, J. / Fanning, T. / Dudley, M.

Zugriff

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Titel:

Investigation of Semiconductor Heterostructures by White Beam Synchrotron X-Ray Topography in Grazing Bragg-Laue and Conventional Bragg Geometries

Beteiligte:

Yao, G.-D. (Autor:in) / Wu, J. (Autor:in) / Fanning, T. (Autor:in) / Dudley, M. (Autor:in)

Erschienen in:

ADVANCES IN X RAY ANALYSIS ; 247

Erscheinungsdatum:

01.01.1993

Format / Umfang:

247 pages

ISSN:

0376-0308

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Unbekannt

Klassifikation:

DDC: 539.7222

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