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    Investigation of Semiconductor Heterostructures by White Beam Synchrotron X-Ray Topography in Grazing Bragg-Laue and Conventional Bragg Geometries

    New search for: Yao, G.-D.
    New search for: Wu, J.
    New search for: Fanning, T.
    New search for: Dudley, M.

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    Investigation of Semiconductor Heterostructures by White Beam Synchrotron X-Ray Topography in Grazing Bragg-Laue and Conventional Bragg Geometries

    New search for: Yao, G.-D.
    New search for: Wu, J.
    New search for: Fanning, T.
    New search for: Dudley, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Investigation of Semiconductor Heterostructures by White Beam Synchrotron X-Ray Topography in Grazing Bragg-Laue and Conventional Bragg Geometries

    New search for: Yao, G.-D.
    New search for: Wu, J.
    New search for: Fanning, T.
    New search for: Dudley, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Investigation of Semiconductor Heterostructures by White Beam Synchrotron X-Ray Topography in Grazing Bragg-Laue and Conventional Bragg Geometries

    Contributors:

    Yao, G.-D. (author) / Wu, J. (author) / Fanning, T. (author) / Dudley, M. (author)

    Published in:

    ADVANCES IN X RAY ANALYSIS ; 247

    Publication date:

    1993-01-01

    Size:

    247 pages

    ISSN:

    0376-0308

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  539.7222

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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