Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Observation, analysis, and simulation of the hysteresis of silicon using ultra-micro-indentation with spherical indenters
Observation, analysis, and simulation of the hysteresis of silicon using ultra-micro-indentation with spherical indenters
Observation, analysis, and simulation of the hysteresis of silicon using ultra-micro-indentation with spherical indenters
Weppelmann, E. R. (Autor:in) / Field, J. S. (Autor:in) / Swain, M. V. (Autor:in)
01.01.1993
830 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Ultra-micro-indentation of silicon and compound semiconductors with spherical indenters
| British Library Online Contents | 1999
Nano-Indentation Using Spherical Indenters
| British Library Online Contents | 2001
Simulation of sub-micron indentation tests with spherical and Berkovich indenters
| British Library Online Contents | 2001
Study of analysis methods of depth-sensing indentation test data for spherical indenters
| British Library Online Contents | 2001
Methods of correction for analysis of depth-sensing indentation test data for spherical indenters
| British Library Online Contents | 2001