A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Observation, analysis, and simulation of the hysteresis of silicon using ultra-micro-indentation with spherical indenters
Observation, analysis, and simulation of the hysteresis of silicon using ultra-micro-indentation with spherical indenters
Observation, analysis, and simulation of the hysteresis of silicon using ultra-micro-indentation with spherical indenters
Weppelmann, E. R. (author) / Field, J. S. (author) / Swain, M. V. (author)
1993-01-01
830 pages
Article (Journal)
Unknown
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Ultra-micro-indentation of silicon and compound semiconductors with spherical indenters
| British Library Online Contents | 1999
Nano-Indentation Using Spherical Indenters
| British Library Online Contents | 2001
Simulation of sub-micron indentation tests with spherical and Berkovich indenters
| British Library Online Contents | 2001
Study of analysis methods of depth-sensing indentation test data for spherical indenters
| British Library Online Contents | 2001
Measurement of residual stress by load and depth sensing indentation with spherical indenters
| British Library Online Contents | 2001