Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Wear resistance of C^+-implanted silicon investigated by scanning probe microscopy
Wear resistance of C^+-implanted silicon investigated by scanning probe microscopy
Wear resistance of C^+-implanted silicon investigated by scanning probe microscopy
Miyamoto, T. (Autor:in) / Miyake, S. (Autor:in) / Kaneko, R. (Autor:in)
WEAR -LAUSANNE- ; 162/164 ; 733
01.01.1993
733 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11292
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