Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
A method for preparing atom probe specimens for nanoscale compositional analysis of metallic thin films
A method for preparing atom probe specimens for nanoscale compositional analysis of metallic thin films
A method for preparing atom probe specimens for nanoscale compositional analysis of metallic thin films
Hasegawa, N. (Autor:in) / Hono, K. (Autor:in) / Okano, R. (Autor:in) / Fujimori, H. (Autor:in)
APPLIED SURFACE SCIENCE ; 67 ; 407
01.01.1993
407 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
621.35
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
Atom probe tomography of nanoscale electronic materials
| British Library Online Contents | 2016
Compositional distributions In nanoscale metallic multilayers studied using x-ray mapping
| British Library Online Contents | 2001
Atom probe tomography of metallic nanostructures
| British Library Online Contents | 2016
Notch sensitivity in nanoscale metallic glass specimens: Insights from continuum simulations
| British Library Online Contents | 2016
Atom probe analysis of sputtered Co-Cr magnetic thin films
| British Library Online Contents | 1993