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Combined analysis of overlayer/S/GaAs interfaces with photoemission spectroscopy and X-ray standing wave
Combined analysis of overlayer/S/GaAs interfaces with photoemission spectroscopy and X-ray standing wave
Combined analysis of overlayer/S/GaAs interfaces with photoemission spectroscopy and X-ray standing wave
Oshima, M. (Autor:in) / Scimeca, T. (Autor:in) / Sugiyama, M. (Autor:in) / Maeyama, S. (Autor:in)
APPLIED SURFACE SCIENCE ; 70/71 ; 496
01.01.1993
496 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
621.35
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