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    Combined analysis of overlayer/S/GaAs interfaces with photoemission spectroscopy and X-ray standing wave

    New search for: Oshima, M.
    New search for: Scimeca, T.
    New search for: Sugiyama, M.
    New search for: Maeyama, S.

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    Combined analysis of overlayer/S/GaAs interfaces with photoemission spectroscopy and X-ray standing wave

    New search for: Oshima, M.
    New search for: Scimeca, T.
    New search for: Sugiyama, M.
    New search for: Maeyama, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Combined analysis of overlayer/S/GaAs interfaces with photoemission spectroscopy and X-ray standing wave

    New search for: Oshima, M.
    New search for: Scimeca, T.
    New search for: Sugiyama, M.
    New search for: Maeyama, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
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    Document information
    Title:

    Combined analysis of overlayer/S/GaAs interfaces with photoemission spectroscopy and X-ray standing wave

    Contributors:

    Oshima, M. (author) / Scimeca, T. (author) / Sugiyama, M. (author) / Maeyama, S. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 70/71 ; 496

    Publication date:

    1993-01-01

    Size:

    496 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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