Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
The refractive index of InP and its oxide measured by multiple-angle incident ellipsometry
The refractive index of InP and its oxide measured by multiple-angle incident ellipsometry
The refractive index of InP and its oxide measured by multiple-angle incident ellipsometry
Tien Sheng Chao (Autor:in) / Chung Len Lee (Autor:in) / Tan Fu Lei (Autor:in)
JOURNAL OF MATERIALS SCIENCE LETTERS ; 12 ; 721
01.01.1993
721 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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