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The refractive index of InP and its oxide measured by multiple-angle incident ellipsometry
The refractive index of InP and its oxide measured by multiple-angle incident ellipsometry
The refractive index of InP and its oxide measured by multiple-angle incident ellipsometry
Tien Sheng Chao (author) / Chung Len Lee (author) / Tan Fu Lei (author)
JOURNAL OF MATERIALS SCIENCE LETTERS ; 12 ; 721
1993-01-01
721 pages
Article (Journal)
Unknown
DDC:
620.11
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