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Influence of thickness inhomogeneity on the determination of optical constants of amorphous silicon thin films
Influence of thickness inhomogeneity on the determination of optical constants of amorphous silicon thin films
Influence of thickness inhomogeneity on the determination of optical constants of amorphous silicon thin films
Pisarkiewicz, T. (Autor:in) / Czapla, A. (Autor:in) / Czternastek, H. (Autor:in)
APPLIED SURFACE SCIENCE ; 65//66 ; 511
01.01.1993
511 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
621.35
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