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    Influence of thickness inhomogeneity on the determination of optical constants of amorphous silicon thin films

    New search for: Pisarkiewicz, T.
    New search for: Czapla, A.
    New search for: Czternastek, H.

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    Influence of thickness inhomogeneity on the determination of optical constants of amorphous silicon thin films

    New search for: Pisarkiewicz, T.
    New search for: Czapla, A.
    New search for: Czternastek, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Influence of thickness inhomogeneity on the determination of optical constants of amorphous silicon thin films

    New search for: Pisarkiewicz, T.
    New search for: Czapla, A.
    New search for: Czternastek, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Influence of thickness inhomogeneity on the determination of optical constants of amorphous silicon thin films

    Contributors:

    Pisarkiewicz, T. (author) / Czapla, A. (author) / Czternastek, H. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 65//66 ; 511

    Publication date:

    1993-01-01

    Size:

    511 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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