Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Eine Plattform für die Wissenschaft: Bauingenieurwesen, Architektur und Urbanistik
Characterisation of TiN coatings and of the TiN/Si interface by X-ray photoelectron spectroscopy and Auger electron spectroscopy
Characterisation of TiN coatings and of the TiN/Si interface by X-ray photoelectron spectroscopy and Auger electron spectroscopy
Characterisation of TiN coatings and of the TiN/Si interface by X-ray photoelectron spectroscopy and Auger electron spectroscopy
Jouan, P.-Y. (Autor:in) / Peignon, M.-C. (Autor:in) / Cardinaud, C. (Autor:in) / Lemperiere, G. (Autor:in)
APPLIED SURFACE SCIENCE ; 68 ; 595
01.01.1993
595 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
621.35
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Reference data for Auger electron spectroscopy and X-ray photoelectron spectroscopy combined
| British Library Online Contents | 1999
Some Issues in Quantitative X-ray Photoelectron Spectroscopy and Auger-Electron Spectroscopy
| British Library Conference Proceedings | 2001
Auger electron and photoelectron spectroscopy of passivating films on thinplate
| British Library Online Contents | 2003
X-ray photoelectron spectroscopy and auger electron spectroscopy studies of Al-doped ZnO films
| British Library Online Contents | 2000
Auger and Photoelectron Spectroscopy of Metastable Ceramic Oxynitrides
| British Library Conference Proceedings | 1999