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Room temperature photoreflectance as a powerful tool to characterize the crystalline quality of InAlAs layers grown on InP substrates
Room temperature photoreflectance as a powerful tool to characterize the crystalline quality of InAlAs layers grown on InP substrates
Room temperature photoreflectance as a powerful tool to characterize the crystalline quality of InAlAs layers grown on InP substrates
Moneger, S. (Autor:in) / Tabata, A. (Autor:in) / Bru, C. (Autor:in) / Guillot, G. (Autor:in)
01.01.1993
177 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.11
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