Room temperature photoreflectance as a powerful tool to characterize the crystalline quality of InAlAs layers grown on InP substrates: Fid-Bau Portal

Room temperature photoreflectance as a powerful tool to characterize the crystalline quality of InAlAs layers grown on InP substrates

Moneger, S. / Tabata, A. / Bru, C. / Guillot, G.

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Room temperature photoreflectance as a powerful tool to characterize the crystalline quality of InAlAs layers grown on InP substrates

Moneger, S. / Tabata, A. / Bru, C. / Guillot, G.

Room temperature photoreflectance as a powerful tool to characterize the crystalline quality of InAlAs layers grown on InP substrates

Moneger, S. / Tabata, A. / Bru, C. / Guillot, G.

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Document information

Title:

Room temperature photoreflectance as a powerful tool to characterize the crystalline quality of InAlAs layers grown on InP substrates

Contributors:

Moneger, S. (author) / Tabata, A. (author) / Bru, C. (author) / Guillot, G. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 21 ; 177

Publication date:

1993-01-01

Size:

177 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.11

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