Depth resolution for AES sputter profiles of GaAs/GaInAs strained superlattices

Morais, J. / Fazan, T. A. / Landers, R. | British Library Online Contents | 1993

Evaluation of reactive ion etching processes for fabrication of integrated GaAs/AlGaAs optoelectronic devices

Aperathitis, E. / Cengher, D. / Kayambaki, M. et al. | British Library Online Contents | 2001

Erbium in Silicon: A Defect System for Optoelectronic Integrated Circuits

Michel, J. / Palm, J. / Gan, F. et al. | British Library Online Contents | 1995

Study on the surface of AlGaInP

Lian, J. / Wang, Q. / Cheng, X. et al. | British Library Online Contents | 2003

Photoreflectance spectroscopy of semiconductor structures at hydrostatic pressure: A comparison of GaInAs/GaAs and GaInNAs/GaAs single quantum wells

Kudrawiec, R. / Misiewicz, J. | British Library Online Contents | 2006