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Ultrasonic System for Detecting Defects in IC Package Using Leaky Lamb Wave Device
Ultrasonic System for Detecting Defects in IC Package Using Leaky Lamb Wave Device
Ultrasonic System for Detecting Defects in IC Package Using Leaky Lamb Wave Device
Toda, K. (Autor:in) / Sawaguchi, A. (Autor:in)
NONDESTRUCTIVE TESTING AND EVALUATION ; 10 ; 137
01.01.1992
137 pages
Aufsatz (Zeitschrift)
Unbekannt
DDC:
620.1127
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