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Ultrasonic System for Detecting Defects in IC Package Using Leaky Lamb Wave Device

Toda, K. / Sawaguchi, A.

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Ultrasonic System for Detecting Defects in IC Package Using Leaky Lamb Wave Device

Toda, K. / Sawaguchi, A.

Ultrasonic System for Detecting Defects in IC Package Using Leaky Lamb Wave Device

Toda, K. / Sawaguchi, A.

Access

Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Ultrasonic System for Detecting Defects in IC Package Using Leaky Lamb Wave Device

Contributors:

Toda, K. (author) / Sawaguchi, A. (author)

Published in:

NONDESTRUCTIVE TESTING AND EVALUATION ; 10 ; 137

Publication date:

1992-01-01

Size:

137 pages

ISSN:

1058-9759

Type of media:

Article (Journal)

Type of material:

Language:

Unknown

Classification:

DDC: 620.1127

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